Digital Speckle Pattern Interferometry (DSPI)
Used instruments:
- konstrukcja własna
producer: IJH PAN
parameters : Mierzy pole odkształceń w jednym kierunku z dokładnością do 20nm
description: Ilościowa analiza defektów powierzchni - pęknięcia i odspojenia warstw powierzchniowych.
CH objects to be tested
- easel painting
- wall painting
- wooden sculpture (polychrome)
- other sculpture
- objects on paper and parchment
- leather objects
- metal objects
- objects made of plastic and other contemporary materials
- photography
The applicability of the method regarding the components
a. The substrate or construction material
- wood
- metal
- paper
- parchment
- stone
- brick
- bone
- amber
Type of examination
a. Type of information acquired
- recognition of the internal structure (eg. layered) of artwork
- mapping the artwork's surface
b. The size of examination area
- information obtained from an area (imaging)
The level of invasiveness
- Examination is non-invasive
- Examination can be carried out at the place of storage of the object
Owner or manager of the installation
institution: Instytut Katalizy i Fizykochemii Powierzchni im. Jerzego Habera PANaddress: Niezpominajek 8.
contact person: title/degree, name and family name: Prof. Roman Kozłowski
email: nckozlow@cyf-kr.edu.pl
phone: 126395190
Possibility of cooperation or use*
- looking for partners for scientific collaboration
- we can performed examinations based on the mandate contract
- we can perform limited scope of the examination for free
*the options above do not constitute an offer within the meaning of commercial law