X-ray Fluorescence Analysis (XRF)
Used instruments:
- spektrometr rentgenowski z całkowitym odbiciem (TXRF)
producer: PicoTAX –wykonany w Institute for Environmental Technologies, Berlin
parameters : Powierzchnia czynna – 80 mm2, grubość – 5 mm, zdolność rozdzielcza 180 eV dla linii MnKα o energii 5,9keV
description: Analiza zarejestrowanych widm wzbudzonego promieniowania rentgenowskiego wykonuje się przy pomocy programów AXIL-QXAS , opracowanych i rozpowszechnianych przez MAEA w Wiedniu. W przypadku TXRF konieczność
CH objects to be tested
- easel painting
- wall painting
- wooden sculpture (polychrome)
- other sculpture
- stained glass
- other historical glass
- leather objects
- metal objects
- ceramics
The applicability of the method regarding the components
a. The substrate or construction material
- wood
- canvas
- metal
- glass
- stone
- brick
- bone
- amber
b. Components of decorative layers
- pigments and mineral fillers
- precious and semi-precious stones
Type of examination
a. Type of information acquired
- identification of elemental composition
The level of invasiveness
- Examination requires a sample which is not destroyed during the study
- Examination may be carried out only in the laboratory
Owner or manager of the installation
institution: Instytut Chemii i Techniki Jądrowejfaculty/department: Laboratorium Badań Materiałowych
address: ul. Dorodna 16, 03-195 Warszawa
contact person: title/degree, name and family name: Mgr inż. Ewa Pańczyk
email: e.panczyk@ichtj.waw.pl
phone: 22 504 11 14
Possibility of cooperation or use*
- looking for partners for scientific collaboration
- we can performed examinations based on the mandate contract
- we can perform limited scope of the examination for free
notes: możemy wykonać badanie bezpłatnie przy wstępnych badaniach
*the options above do not constitute an offer within the meaning of commercial law