Scanning Electron Microscopy - Electron Backscattered Diffraction (SEM-EBSD)
Used instruments:
- Nordlys HKL Technology
producer: HKL Technology
description: Analiza krystalografii ziaren metodą dyfrakcji elektronów.
CH objects to be tested
- metal objects
The applicability of the method regarding the components
a. The substrate or construction material
- metal
Type of examination
a. Type of information acquired
- recognition of the internal structure (eg. layered) of artwork
b. The size of examination area
- information obtained from an area (imaging)
The level of invasiveness
- Examination requires a sample which is not destroyed during the study
- Examination may be carried out only in the laboratory
Owner or manager of the installation
institution: Akademia Górniczo-Hutnicza w Krakowie (Centrum Badań Nawarstwień Historycznych)faculty/department: Wydział Metali Nieżelaznych
address: al. Mickiewicza 30, 30-059 Kraków
contact person: title/degree, name and family name: dr inż. Aldona Garbacz-Klempka; dr inż. Małgorzata Perek-Nowak
email: agarbacz@agh.edu.pl; mperek@agh.edu.pl
phone: 12 617 2774; 12 617 4599
Possibility of cooperation or use*
- looking for partners for scientific collaboration
- we can performed examinations based on the mandate contract
- we can perform limited scope of the examination for free
*the options above do not constitute an offer within the meaning of commercial law